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Current-Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope

Materials
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Contributing authors of JOANNEUM RESEARCH:
DI Alexander Fian
Authors
Timm, Rainer; Persson, Olof; Engberg, David L. J.; Fian, Alexander; Webb, James L.; Wallentin, Jesper; Jönsson, Andreas; Borgström, Magnus T.; Samuelson, Lars; Mikkelsen, Anders
Title:
Current-Voltage Characterization of Individual As-Grown Nanowires Using a Scanning Tunneling Microscope
Seiten:
5182–5189
Publikationsdatum
2013-11

Publikationsreihe

Nummer
13
Beitrag
11
ISSN
1530-6984
Proceedings
Nano Lett.
More files and links
https://doi.org/10.1021/nl402570u
DOI-Url:
https://www.doi.org/ 10.1021/nl402570u
Jahr/Monat:
2013
Bibtex Download

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