• Menü menu
  • menu open menu
Publications
Materials

Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Contributing authors of JOANNEUM RESEARCH:
Authors
Neuschitzer, Markus; Moser, Armin; Neuhold, Alfred; Kraxner, Johanna; Stadlober, Barbara; Oehzelt, Martin; Salzmann, Ingo; Resel, Roland; Novák, Jiří
Abstract:
A novel grazing-incidence in-plane X-ray diffraction setup based on a commercial four-circle diffractometer with a sealed-ceramic copper X-ray tube, upgraded with parabolic graded multilayer X-ray optics and a one-dimensional position-sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in-plane lattice constants of pentacene mono- and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.
Title:
Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment
Seiten:
367-370
Publikationsdatum
2012

Publikationsreihe

Nummer
45
Beitrag
2
Proceedings
Journal of Applied Crystallography

Related publications

Skip to content