• Menu menu
  • menu Menü öffnen
Research infrastructure  
Materials

Surface Characterisation Lab

Measurement and analysis of the smallest structures, layers and components on a micro- and nanometre scale

 

Jupiter XR Atomic Force Microscope (AFM), Foto: JOANNEUM RESEARCH/Bergmann

With our Surface Characterisation Lab we offer measurement and analysis of the smallest structures, layers and components on a micro- and nanometre scale.

If you come from a scientific background, this is just as interesting as it is for industrial customers. We use the following technologies for our measurements: 

  • Atomic force microscopy (AFM)
  • confocal laser scanning microscopy from Keyence with large stage
  • Ultra-microtomy for precision sections in combination with electron beam lithography (SEM)
  • X-ray and UV photoelectron spectroscopy (XPS/UPS) and SEM/EDX
  • Ellipsometry
  • UV-VIS-NIR spectroscopy 
  • Fluorescence analysis
  • X-ray fluorescence analysis

 

Contact

Your contact

Mag. Dr. Philipp Schäffner

Location

MATERIALS – 
Institute for Sensors, Photonics and Manufacturing Technologies
Franz-Pichler-Straße 30,
8160
Weiz

Das sagen unsere Kunden

Further research infrastructure

Skip to content